Proc. 3rd European Symposium “X-Ray Topography and High Resolution Diffraction” (Palermo, Italy, 22-24 April 1996), P. 49сборник
Статьи, опубликованные в сборнике
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1996
An advanced X-ray HRD studies of microdefects in Si doped GaAs bulk crystal
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Lomov A.A.,
Bushuev V.A.,
Franzosi P.,
Bocchi C.,
Imamov R.M.
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в сборнике Proc. 3rd European Symposium “X-Ray Topography and High Resolution Diffraction” (Palermo, Italy, 22-24 April 1996), P. 49, место издания Rome, тезисы, с. 49-49