In Situ Characterization of XFEL Beam Intensity Distribution and Focusability by High-Resolution LiF Crystal Detector

Авторы: Pikuz T., Faenov A., Matsuoka T., Albertazzi B., Ozaki N., Hartely N., Muray Ricardo Arturo O., Yabuuchi T., Habara H., Matsuyama S., Yamauchi K., Inubushi Y., Togashi T., Yumoto H., Tange Y., Tono K., Sato Y., Yabashi M., Nishikino M., Kawachi T., Mitrofanov A., Bleiner D., Grum-Grzhimailo A., Rosanov N.N., Vysotina N.V., Harmand M., Koenig M., Tanaka K.A., Ishikawa T., Kodama R.
Сборник: 15th International Conference on X-Ray Lasers 2016. Conference Program and Book of Abstracts. May 22nd - 27th, 2016 Nara Kasugano International Forum, Iraka, Japan
Тезисы
Год издания: 2016
Первая страница: 75
Последняя страница: 75
Аннотация: We present here a new X-rays diagnostic based on using LiF X-ray crystal detectors that is able to perform in situ measurements the intensity distribution of X-rays beams with diameters ranging from some microns up to some centimeters with high spatial resolution (~ 1μm.) We demonstrated also, that by means of the LiF crystal submicron spatial resolution X-ray detector, in situ 3D visualization of SACLA XFEL focused beam profile along propagation, including propagation inside photoluminescence solid materials
Добавил в систему: Грум-Гржимайло Алексей Николаевич

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