ИСТИНА

Weimann T.

Соавторы: Зорин А.Б., Niemeyer J., Scherer H., Крупенин В.А., Lotkhov S.V., Wolf H., Ahlers F.J., Преснов Д.Е., Kieler O.F., Kleiner R., Koelle D., Kohlmann J., Buchter A. показать полностью..., Grundler D., Kemmler M., Morral A.F., Nagel J., Poggio M., Rüffer D., Berberich P., Hinze P., Huber R., Pashkin Y.A., Pavolotski A.B., Russo-Averchi E., Samwer B.W., Wölbing R., Xue F., Zangerle H., Bastian G., Bennett M.R., Göbel E.O., Heimbach F., Kleibert A., Matteini F., Quenter D., Schulze H., Singer K.E., Tütüncüoglu G., Weber D.P., Wyss M., Кузьмин Л.С., Тавхелидзе А.Н.

21 статья, 3 тезисов докладов

Количество цитирований статей в журналах по данным Web of Science: 317, Scopus: 316

IstinaResearcherID (IRID): 544430

Деятельность

• Статьи в журналах

  • 
    • 2015 Magnetization reversal of an individual exchange-biased permalloy nanotube
    • Buchter A., Wolbing R., Wyss M., Kieler O.F., Weimann T., Kohlmann J., Zorin A.B., Ruffer D., Matteini F., Tütüncüoglu G., Heimbach F., Kleibert A., Morral A.Fontcuberta i, Grundler D., Kleiner R., Koelle D., Poggio M.
    • в журнале Physical Review B, издательство American Physical Society (United States), том 92, № 21, с. 214432-1-214432-7 DOI
  • 
    • 2013 Nanoscale multifunctional sensor formed by a Ni nanotube and a scanning Nb nanoSQUID
    • Nagel J., Buchter A., Xue F., Kieler O.F., Weimann T., Kohlmann J., Zorin A.B., Rüffer D., Russo-Averchi E., Huber R., Berberich P., Morral A.Fontcuberta i, Grundler D., Kleiner R., Koelle D., Poggio M., Kemmler M.
    • в журнале Physical Review B, издательство American Physical Society (United States), том 88, № 6, с. 064425-1-064425-7 DOI
  • 
    • 2013 Reversal Mechanism of an Individual Ni Nanotube Simultaneously Studied by Torque and SQUID Magnetometry
    • Buchter A., Nagel J., Rüffer D., Xue F., Weber D.P., Kieler O.F., Weimann T., Kohlmann J., Zorin A.B., Russo-Averchi E., Huber R., Berberich P., Morral A.Fontcuberta i, Kemmler M., Kleiner R., Koelle D., Grundler D., Poggio M.
    • в журнале Physical Review Letters, издательство American Physical Society (United States), том 111, № 6, с. 067202-1-067202-5 DOI
  • 
    • 2011 Superconducting quantum interference devices with submicron Nb/HfTi/Nb junctions for investigation of small magnetic particles
    • Nagel J., Kieler O.F., Weimann T., Wölbing R., Kohlmann J., Zorin A.B., Kleiner R., Koelle D., Kemmler M.
    • в журнале Applied Physics Letters, издательство AIP Publishing (United States), том 99, № 3, с. 032506-032506 DOI
  • 
    • 2001 Four-angle evaporation method for the preparation of single electron tunneling devices
    • Weimann T., Scherer H., Krupenin V.A., et al.
    • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 57, № 8, с. 915 DOI
  • 
    • 2001 The effect of thermal annealing on the properties of Al-AlOx-Al single electron tunneling transistors
    • Scherer H., Weimann Th, Zorin A.B., Niemeyer J.
    • в журнале Journal of Applied Physics, издательство AIP Publishing (United States), том 90, № 5, с. 2528-2532
  • 
    • 2000 All-chromium single electron tunneling devices fabricated by direct-writing multilayer technique
    • Scherer H., Hinze P., Weimann Th, Samwer B.W., Zorin A.B., Niemeyer J.
    • в журнале Physica B: Condensed Matter, издательство Elsevier BV (Netherlands), том 284, с. 1806-1807
  • 
    • 1999 A Superconducting Electrometer Based on the Resitively Shunted Bloch Transistor
    • Lotkhov S.V., Zangerle H., Zorin A.B., Weimann Th, Scherer H., Niemeyer J.
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 9, с. 3664-3667
  • 
    • 1999 Characterization of All-chromium Tunnel Junctions and Single-electron Tunneling Devices Fabricated by Direct-writing Multilayer Technique
    • Scherer H., Weimann Th, Hinze P., Samwer B.W., Zorin A.B., Niemeyer J.
    • в журнале Journal of Applied Physics, издательство AIP Publishing (United States), том 86, № 12, с. 6956-6964
  • 
    • 1999 Charging and heating effects in a system of coupled single-electron devices
    • Krupenin V.A., Lotkhov S.V., Scherer H., Zorin A.B., Weimann Th, Ahlers F.J., Niemeyer J., Wolf H.
    • в журнале Physical Review B, издательство American Physical Society (United States), том 59, № 16, с. 10778-10784 DOI
  • 
    • 1999 Highly sensitive electrometers based on single Cooper pair tunneling
    • Zorin A.B., Lotkhov S.V., Pashkin Yu A., Zangerle H., Krupenin V.A., Weimann Th, Scherer H., Niemeyer J.
    • в журнале Journal of Superconductivity (Plenum), том 12, № 6, с. 747-755 DOI
  • 
    • 1999 Multilayer techinque for fabricating Nb junction circuits exhibiting charging effects
    • Pavolotsky A.V., Weimann Th, Scherer H., Krupenin V.A., Niemeyer J., Zorin A.B.
    • в журнале Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, издательство AIP Publishing (United States), том 17, № 1, с. 230-232 DOI
  • 
    • 1999 Novel Method for Fabricating Deep Submicron Nb/AlOx/Nb Tunnel Junctions Based on Spin-on Glass Planarization
    • Pavolotsky A.B., Weimann Th, Scherer H., Niemeyer J., Zorin A.B., Krupenin V.A.
    • в журнале IEEE Transactions on Applied Superconductivity, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 9, № 2, с. 3251-3254 DOI
  • 
    • 1998 A New Technology for Metallic Multilayer Single Electron Tunneling Devices
    • Weimann Th, Scherer H., Wolf H., Krupenin V.A., Niemeyer J.
    • в журнале Microelectronic Engineering, издательство Elsevier BV (Netherlands), том 41, № 42, с. 559-562 DOI
  • 
    • 1998 Quasiparticle Interference Effects in a Ballistic Superconductor-Semiconductor-Superconductor Josephson Junction
    • Bastian G., Göbel E.O., Zorin A.B., Schulze H., Niemeyer J., Weimann T., Bennett M.R., Singer K.E.
    • в журнале Physical Review Letters, издательство American Physical Society (United States), том 81, № 8, с. 1686-1689 DOI
  • 
    • 1997 Investigation of the offset charge noise in single electron tunneling devices
    • Wolf H., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Zorin A.B., Krupenin V.A., Lotkhov S.V., Presnov D.E.
    • в журнале IEEE Transactions on Instrumentation and Measurement, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 46, № 2, с. 303-306 DOI
  • 
    • 1997 Metallic single electron devices fabricated using a multilayer technique
    • Weimann T., Wolf H., Scherer H., Krupenin V.A., Niemeyer J.
    • в журнале Applied Physics Letters, издательство AIP Publishing (United States), том 71, с. 713 DOI
  • 
    • 1996 An all-chromium single electron transistor: A possible new element of single electronics
    • Kuzmin L.S., Pashkin Y.A., Tavkhelidze A.N., Ahlers F.J., Weimann T., Quenter D., Niemeyer J.
    • в журнале Applied Physics Letters, издательство AIP Publishing (United States), том 68, № 20, с. 2902-2904 DOI
  • 
    • 1996 Charge state instabilities in the single-electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Zorin A.B., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Wolf H.
    • в журнале Czechoslovak Journal of Physics, издательство Kluwer Academic/Plenum Publishers (United States), том 46, № 4, с. 2283-2284 DOI
  • 
    • 1996 Detection of the single electron tunneling noise using Coulomb blockade electrometer
    • Zorin A.B., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Wolf H., Ahlers F.J., Weimann T.
    • в журнале Czechoslovak Journal of Physics, издательство Kluwer Academic/Plenum Publishers (United States), том 46, № 4, с. 2281-2282 DOI

• Статьи в сборниках

  • 
    • 1996 Investigation of the offset charge noise in single electron tunneling devices
    • Ahlers F.J., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Weimann T., Wolf H., Zorin A.B.
    • в сборнике CPEM (Conference on Precision Electromagnetic Measurements) Digest. Proceedings of the 1996 Conference on Precision Electromagnetic Measurements (17-20 June 1996, Braunschweig, Germany), издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), с. 507-508 DOI

• Тезисы докладов

  • • 1996 Charge state instabilities in the single-electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Zorin A.B., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Wolf H.
    • в сборнике Abstracts of the 21st International Conference on Low Temperature Physics, место издания Prague, Czech Republic, 8-14 August, тезисы, с. 308
  • • 1996 Detection of the single-electron tunneling noise using Coulomb blockade electrometer
    • Zorin A.B., Krupenin V.A., Lotkhov S.V., Niemeyer J., Presnov D.E., Scherer H., Wolf H., Ahlers F.J., Weimann T.
    • в сборнике Abstracts of the 21st International Conference on Low Temperature Physics, место издания Prague, Czech Republic, 8-14 August, тезисы, с. 308
  • • 1996 Verification of a memory cell based on a single electron trap
    • Krupenin V.A., Lotkhov S.V., Presnov D.E., Wolf H., Ahlers F.J., Niemeyer J., Scherer H., Weimann T., Zorin A.B.
    • в сборнике Abstracts of IX Trilateral German - Russian - Ukrainian Seminar on High-Temperature Superconductivity, место издания Gabelbach Germany, 22-25 September, тезисы, с. 22