del Val J.J.
Количество цитирований статей в журналах по данным
Web of Science: 26,
Scopus: 26
IstinaResearcherID (IRID): 1956860
Деятельность
-
Статьи в журналах
-
-
-
2018
Effect of annealing on magnetic properties of Ni–Mn–Ga glass-coated microwires
-
Zhukov A.,
Ipatov M.,
Del Val J.,
Corte-León P.,
Gonzalez J.,
Granovsky A.,
Zhukova V.
-
в журнале Journal of Materials Research, издательство Materials Research Society (United States), том 33, № 15, с. 2148-2155
DOI
-
-
2018
Effect of annealing on magnetic properties of Ni–Mn–Ga glass-coated microwires
-
Zhukov A.,
Ipatov M.,
Del Val J.,
Corte-León P.,
Gonzalez J.,
Granovsky A.,
Zhukova V.
-
в журнале Journal of Materials Research, издательство Materials Research Society (United States), том 33, № 15, с. 2148-2155
-
-
-
-
-
2018
Tuning of Magnetic Properties of Ni–Mn–Ga Glass-Coated Microwires
-
Zhukova Valentina,
Ipatov Mihail,
Juan Jose del Val,
Granovsky Alexandr,
Zhukov Arcady
-
в журнале IEEE Transactions on Magnetics, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 54, № 6, с. 1-4
-
-
2017
GMR and Kondo Effects in Cu-Co Microwires
-
Valentina Zhukova,
Jakub Mino,
Juan Jose del Val,
Mihail Ipatov,
Rastislav Varga,
Mario Baibich,
Gerardo Martinez,
Alexandr Granovsky,
Arcady Zhukov
-
в журнале Journal of Superconductivity and Novel Magnetism, издательство Springer Verlag (Germany), том 30, № 4, с. 1109-1114
DOI
-
-
-
2012
Kondo effect and magnetotransport properties in Co-Cu microwires
-
Ilyn M.,
Zhukova V.,
Garcia C.,
del Val J.J.,
Granovsky A.,
Zhukov A.
-
в журнале IEEE Transactions on Magnetics, издательство Institute of Electrical and Electronics Engineers (Piscataway, NJ, United States), том 48, № 11, с. 3532-3535
DOI
-
Статьи в сборниках
-
-
2016
Magnetic and Transport Properties of M-Cu (M=Co, Fe) Microwires
-
Zhukov A.,
Ipatov M.,
del Val J.J.,
Ilyn M.,
Granovsky A.,
Zhukova V.
-
в сборнике Smart Sensors, Measurement and Instrumentation, место издания Springer International Publishing Switzerland, том 16, с. 81-102