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Статьи в журналах
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- 2020 An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser
- Assalauova Dameli, Kim Young Yong, Bobkov Sergey, Khubbutdinov Ruslan, Rose Max, Alvarez Roberto, Andreasson Jakob, Balaur Eugeniu, Contreras Alice, DeMirci Hasan, Gelisio Luca, Hajdu Janos, Hunter Mark S., Kurta Ruslan P., Li Haoyuan, McFadden Matthew, Nazari Reza, Schwander Peter, Teslyuk Anton, Walter Peter, Xavier P.Lourdu, Yoon Chun Hong, Zaare Sahba, Ilyin Viacheslav A., Kirian Richard A., Hogue Brenda G., Aquila Andrew, Vartanyants Ivan A.
- в журнале International Union of Crystallography Journal, том 7, № 6, с. 1102-1113 DOI
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- 2020 Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range
- Makarov Sergey, Pikuz Sergey, Ryazantsev Sergey, Pikuz Tatiana, Buzmakov Alexey, Rose Max, Lazarev Sergey, Senkbeil Tobias, von Gundlach Andreas, Stuhr Susan, Rumancev Christoph, Dzhigaev Dmitry, Skopintsev Petr, Zaluzhnyy Ivan, Viefhaus Jens, Rosenhahn Axel, Kodama Ryosuke, Vartanyants Ivan A.
- в журнале Journal of Synchrotron Radiation, издательство Blackwell Publishing Inc. (United Kingdom), том 27, № 3 DOI