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Доклады на научных конференциях
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- 1996 An advanced X-ray HRD studies of microdefects in Si doped GaAs bulk crystal.
- Авторы: Ломов А.А., Бушуев В.А., Franzosi P., Имамов Р.М., Bocchi C.
- Proc. 3rd European Symposium “X-Ray Topography and High Resolution Diffraction”, Palermo, Italy, 22-24 April 1996. P. 197. , Palermo, Italy, Италия, 1996