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Triple crystal high resolution x-ray diffraction setup based on adaptive bending X-ray optics (ABXO) elements functioning in fully resonant modeстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 15 октября 2025 г.
- Авторы: Eliovich I.A., Petrov I.I., Akkuratov V.I., Korzhov V.A., Kubasov I.V., Turutin A.V., Kislyuk A.M.
- Журнал: Measurement: Journal of the International Measurement Confederation
- Том: 256
- Год издания: 2025
- Издательство: Elsevier BV
- Местоположение издательства: Netherlands
- Номер статьи: 118255
- DOI: 10.1016/j.measurement.2025.118255
- Аннотация: Traditionally, mechanical goniometric systems providing variation of experimental parameters are used to perform X-ray diffraction measurements. However, they have limited speed and accuracy, which makes it difficult to conduct time-resolved experiments, especially relevant when studying the dynamics of structural changes in crystals. There are several approaches to solve this problem, one of which is the use of Adaptive bending X-ray optics (ABXO) elements. This work presents the implementation of a fast triple-crystal diffractometry technique based on the simultaneous use of two ABXO elements as a monochromator and analyser, rapidly operating in the resonant oscillation mode and synchronized with each other. This approach makes it possible to carry out measurements without variation of experimental parameters using mechanical systems and significantly speeds up the experiment to times determined only by the period of ABXO elements oscillations at resonance mode (tens of milliseconds) when conducting research at X-ray source with sufficient intensity (for example, at synchrotron source).
- Добавил в систему: Петров Иван Игоревич
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