The angular-distribution of material sputtered from agau and cupt by20-80kev argonстатья

Статья опубликована в высокорейтинговом журнале

Информация о цитировании статьи получена из Web of Science
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 27 мая 2015 г.

Работа с статьей


[1] Andersen H. H., Chevallier J., Chernysh V. S. The angular-distribution of material sputtered from agau and cupt by20-80kev argon // Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. — 1981. — Vol. 191, no. 1-3. — P. 241–244. The material sputtered by 20–80 keV argon from films of AgAu and CuPt has been collected on a semicircular aluminum collector. The elemental composition of the sputtered material was determined through the Rutherford scattering of 2 MeV α particles. To ensure a sufficient amount of collected material, irradiation doses were substantially larger than those at which the total sputtered flux had attained a stoichiometric composition. In spite of the fact that the AgAu targets showed a strong crystalline texture while the CuPt targets consisted of fine-grained random polycrystalline materials, the two targets displayed close similarities in the angular distribution of the ratio between light and heavy elements. Material sputtered further than 70o away from the normal could not be measured, but within the investigated region, the composition of the collected material never deviated by more than 15% from the average composition of the sputtered flux. [ DOI ]

Публикация в формате сохранить в файл сохранить в файл сохранить в файл сохранить в файл сохранить в файл сохранить в файл скрыть