Effect of the Concentration of Components in Ni-Pd Alloy Sputteringстатья
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Дата последнего поиска статьи во внешних источниках: 31 октября 2014 г.
Аннотация:The angular distributions of Ni and Pd atoms are obtained under 3- and 10-keV Ar(+) ion bombardment of Ni-Pd alloys with different concentrations of the components and are studied both experimentally and by computer simulation. The angular distributions of the sputtered components are studied by the methods of Rutherford backscattering and X-ray microanalysis, and the composition of the irradiated surface by Auger spectroscopy. It is established that the type of element segregating to the surface changes in passing from NiPd(3) to NiPd(5), which leads to changes in both the angular distributions and the composition of the target surface layer.