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Atomic Force Microscopy and Scanning Ion-Conductance Microscopy for Investigation of Biomechanical Characteristics of Neutrophilsстатья
- Авторы: Shvedov Mikhail, Sherstyukova Ekaterina, Kandrashina Snezhanna, Inozemtsev Vladimir, Sergunova Viktoria
- Журнал: Cells
- Том: 13
- Номер: 21
- Год издания: 2024
- Издательство: MDPI
- Местоположение издательства: Basel, Switzerland
- Первая страница: 1757
- Последняя страница: 1757
- DOI: 10.3390/cells13211757
- Аннотация: Scanning probe microscopy (SPM) is a versatile tool for studying a wide range of materials. It is well suited for investigating living matter, for example, in single-cell neutrophil studies. SPM has been extensively utilized to analyze cell physical properties, providing detailed insights into their structural and functional characteristics at the nanoscale. Its long-standing application in this field highlights its essential role in cell biology and immunology research, significantly contributing to understanding cellular mechanics and interactions. In this review, we discuss the application of SPM techniques, specifically atomic force microscopy (AFM) and scanning ion-conductance microscopy (SICM), to study the fundamental functions of neutrophils. In addition, recent advances in the application of SPM in single-cell immunology are discussed. The application of these techniques allows for obtaining data on the morphology, topography, and mechanical and electrochemical properties of neutrophils with high accuracy.
- Добавил в систему: Шерстюкова Екатерина Александровна