Local Surface Plasmon Resonances in Cu/As Se  Film Structures

Авторы: Kogai V.Ya, Mikheev G.M.
Журнал: JETP Letters
Том: 120
Номер: 3
Год издания: 2024
Издательство: Maik Nauka/Interperiodica Publishing
Местоположение издательства: Russian Federation
Первая страница: 190
Последняя страница: 194
Номер статьи: 3
DOI: 10.1134/S0021364024602458
Аннотация: Plasmon nanostructures are synthesized for the first time as a result of Cu diffusion into an As2Se3 film duringthe formation of a Cu/As Se film structure by the successive deposition of Cu and As2Se3 in vacuum. Usingspectroscopic ellipsometry, the spectra of the extinction coefficients and refractive index, as well as the realand imaginary parts of the permittivity of the synthesized structures in the wavelength range of 240–2500 nm,that indicate the presence of localized surface plasmon resonances are obtained. It is shown that the fre-quency position of plasmon resonances in the wavelength range from 470 to 660 nm can be controlled bychanging the thickness of the copper film and annealing.
Добавил в систему: Михеев Геннадий Михайлович

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