Аннотация:Terahertz time-domain spectroscopy is used to perform the first detailed studies of the electrodynamic properties of MoRe (60/40) films with thicknesses ranging from 10 to 100 nm. Films are prepared by magnetron sputtering technique on silicon substrates. The critical temperatures vary from (for 10 nm film) to (for 100 nm film). Spectra of complex permittivity, conductivity, refraction index, surface impedance and reflection coefficient for the films are acquired at frequencies (wavenumbers ) and in the temperature interval . For all films, temperature dependencies of the superconducting energy gap, penetration depth, superconducting condensate plasma frequency, and normalised superfluid density are obtained on a quantitative level. It is shown that the reduction of film thickness leads to a strong decrease of the critical temperature and magnitude of the energy gap. The observed suppression of superconductivity is assigned to reduction of the superconducting order parameter due to the contribution to the free energy of the electronic energy states at the surface of superconductor. The MoRe films with the obtained characteristics can be used in designing advanced superconducting electronic devices.
