Continuous wavelet transform of a scanning electron microscope image for determining the average size of nanoparticles

Авторы: Semenov V.I., Mikheev K.G., Mogileva T.N., Mikheev G.M.
Журнал: Technical Physics
Том: 67
Номер: 8
Год издания: 2022
Издательство: Maik Nauka/Interperiodica Publishing
Местоположение издательства: Russian Federation
Первая страница: 612
Последняя страница: 617
DOI: 10.1134/s1063784222080096
Аннотация: Measuring the size of nanoparticles is one of the important problems in the study of their physicochemical properties. Currently, methods of static and dynamic light scattering as well as methods of atomic force and scanning electron microscopy are employed to determine the sizes of nanoparticles. This paper reports on the use of continuous wavelet transform of a scanning electron microscope image to determine the average size of diamond nanoparticles. The continuous wavelet transform is calculated in the frequency domain using the fast Fourier transform. The transition to the frequency domain permits the four orders of magnitude reduction in the transformation time as well as the construction of orthogonal wavelets with fractional scale coefficients and a rectangular amplitude response, which is impossible when using a discrete wavelet transform. The obtained results are in good agreement with the nanoparticle size data obtained using an atomic force microscope.
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