Аннотация:Here we present our results on ferromagnetic resonance (FMR) study of NiFe/IrMn/NiFe trilayerstructures with IrMn layer thickness tAF varied from 2 to 50 nm. The set of experimental sampleswas obtained using magnetron sputtering in presence of a constant magnetic field of 420 Oe applied in substrate plain during the layer deposition. The FMR method for exchange-biased structuresmakes it possible to obtain a resonant field and, therefore, the value of the exchange bias. TheFMR linewidth is determined by spin damping and is an important characteristic for the design ofmagnetic devices.