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Fracture strength of optical quality and black polycrystalline CVD diamondsстатья
Информация о цитировании статьи получена из
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Web of Science
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 5 сентября 2016 г.
- Авторы: Ralchenko V.G., Pleuler E., Lu F.X., Sovyk D.N., Bolshakov A.P., Guo S.B., Tang W.Z., Gontar I.V., Khomich A.A., Zavedeev E.V., Konov V.I.
- Журнал: Diamond and Related Materials
- Том: 23
- Год издания: 2012
- Издательство: Elsevier BV
- Местоположение издательства: Netherlands
- Первая страница: 172
- Последняя страница: 177
- DOI: 10.1016/j.diamond.2011.12.031
- Аннотация: Three-point method has been used to measure bending strength sigma(f) of optical quality and opaque polycrystalline diamond films with thickness in the broad range of h = 0.06-1.0 mm grown by microwave plasma CVD. The free-standing films were characterized with microRaman spectroscopy. SEM, and optical profilography. For transparent samples the value of sigma(f) is found to approach 2200 MPa for thinnest sample when the substrate side is under tensile stress, reducing with film thickness to 600 MPa at h approximate to 1000 mu m, while for substrate side under the tension exhibits the strength a factor of two lower. The material tested shows transcrystallite fracture and the strength increase with grain size reduction. Also evaluated are Young modulus E = 1072 +/- 153 GPa, and the Weibull moduli m = 6.4 and m = 4.5 for the growth and substrate sides under tension, respectively. In contrast, the (100) textured black diamond films with pronounced columnar structure demonstrate intergranular fracture mode due to relatively weak (with non-diamond carbon component) grain boundaries, lower fracture surface roughness, and the two times lower strength compared to the "white" diamond. (C) 2011 Elsevier B.V. All rights reserved.
- Добавил в систему: Конов Виталий Иванович