## Stress and strain fields in rotating elastic/plastic annular discsстатья

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Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 30 сентября 2018 г.
• Авторы:
• Журнал: Archive of Applied Mechanics
• Том: 86
• Номер: 1
• Год издания: 2016
• Издательство: Springer Verlag
• Местоположение издательства: Germany
• Первая страница: 235
• Последняя страница: 244
• DOI: 10.1007/s00419-015-1101-9
• Аннотация: The von Mises yield criterion is used in conjunction with its associated flow rule to provide the elastic/plastic stress and strain distributions within the rotating annular discs made of perfectly plastic material under plane stress conditions. The solution for strain rates is reduced to one nonlinear ordinary differential equation and two linear ordinary differential equations. These equations can be solved one by one. The strain solution requires a numerical technique to evaluate ordinary integrals. An example is presented to illustrate the general solution. The general method proposed can be readily extended to orthotropic and pressure-dependent yield criteria.
• Добавил в систему: Ломакин Евгений Викторович

### Работа с статьей

 [1] Lomakin E., Alexandrov S., Jeng Y.-R. Stress and strain fields in rotating elastic/plastic annular discs // Archive of Applied Mechanics. — 2016. — Vol. 86, no. 1. — P. 235–244. The von Mises yield criterion is used in conjunction with its associated flow rule to provide the elastic/plastic stress and strain distributions within the rotating annular discs made of perfectly plastic material under plane stress conditions. The solution for strain rates is reduced to one nonlinear ordinary differential equation and two linear ordinary differential equations. These equations can be solved one by one. The strain solution requires a numerical technique to evaluate ordinary integrals. An example is presented to illustrate the general solution. The general method proposed can be readily extended to orthotropic and pressure-dependent yield criteria. [ DOI ]