Near-field optical microscopy of the elements of optical memoryстатья
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Дата последнего поиска статьи во внешних источниках: 28 мая 2015 г.
Аннотация:The construction of a scanning probe microscope (SPM) used for the study of elements of optical memory and their fine structure has been described. This SPM allows one to carry out investigations by the methods of scanning near-field optical microscopy (SNOM) and atomic force microscopy (AFM). SPM parameters are presented and the technique of the fabrication of the optical probe has been described. Optical parameters of model objects have been measured, and a high spatial optical resolution of SNOM has been demonstrated.