Аннотация:Using a microscopic model we calculate profiles of the order parameter as a function of temperature
and superconducting current for superconducting transition edge sensors (TES) of different sizes and
for different transparency of interfaces between TES and leads. We also present the results of microscopic
calculations of the critical current and current-phase relation as a function of temperature and
device size. The results obtained with the use of the microscopic model are compared with fitting
based on the Ginzburg-Landau theory. We discuss differences between the two models and establish
the validity range of the Ginzburg-Landau based model for typical TES geometry
