The fabrication and study of YBa2Cu3Ox submicron Josephson junctions on bicrystal substratesстатья
Статья опубликована в высокорейтинговом журнале
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:We have developed a technological process for fabrication of YBa2Cu3Ox, (YBCO) submicron wide Josephson junctions (JJ) on bicrystal substrates. This process is based on e-beam lithography and ion beam etching of YBCO films, bicrystal substrates with through carbon masks. A series of JJ with 0.4-1 mum width have been fabricated on SrTiO3 misorientation angles 0 = 24degrees and 36.8degrees using this process. The analysis of the current-voltage characteristics of the fabricated junctions at high bias currents supports the model of electrons tunneling through the localized states (LS) formed in the barrier region. The approximation of experimental data on white noise of the junctions by theoretical formula, which represents the contribution of thermal noise as well as shot noise, shows that tunnel mechanism of electrons transport through the LS greatly dominates a normal metallic one. (C) 2002 Elsevier Science B.V. All rights reserved.