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Photoluminescence Features of Hydrogenated Silicon Films with Amorphous/Nanocrystalline Mixed Phaseстатья
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 9 ноября 2017 г.
- Авторы: Emelyanov A.V., Kazanskii A.G., Forsh P.A., Zhigunov D.M., Khenkin M.V., Petrova N.N., Kukin A.V., Terukov E.I., Kashkarov P.K.
- Журнал: Journal of Nanoelectronics and Optoelectronics
- Том: 10
- Номер: 5
- Год издания: 2015
- Издательство: American Scientific Publishers
- Местоположение издательства: United States
- Первая страница: 649
- Последняя страница: 652
- DOI: 10.1166/jno.2015.1730
- Аннотация: We have studied structural, electrical and photoluminescence properties of hydrogenated nanocrystalline silicon films with different crystalline volume fractions (from 0-pristine amorphous silicon-to 55%). The crystalline volume fraction and the average diameter of Si nanocrystals were estimated using the position and the intensity of the peaks in Raman spectra of the samples. The photoluminescence spectra exhibit distinct features related to recombination in amorphous silicon (peak energy near 1.35 eV) and in silicon nanocrystals (peak near 1.52 eV). When the crystalline volume fraction approaches 55%, photoluminescence disappears. This was due to the appearance of the percolation path consisting of Si nanocrystals. Photoluminescence spectroscopy was proposed as a non-destructive method for determining of a small volume fraction of Si nanocrystals embedded in amorphous silicon.
- Добавил в систему: Жигунов Денис Михайлович