Journal of Electron Spectroscopy and Related Phenomenaжурнал

Статьи, опубликованные в журнале

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  • 2021 Comparison of electron binding energies in Ni3Al, Al, and Ni determined by X-ray photoelectron spectroscopy and quantum-mechanical calculation
  • Vorob’ev V.L., Dobysheva L.V., Drozdov A.Yu, Bykov P.V., Bayankin V.Ya
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 252, с. 1-6 DOI
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  • 2020 XPS and XAS investigations of multilayer nanostructures based on the amorphous CoFeB alloy
  • Domashevskaya E.P., Builov N.S., Ivkov S.A., Guda A.A., Chukavin A.I., Trigub A.L.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), с. 146979 DOI
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  • 2020 XPS detection of unusual Cu(II) to Cu(I) transition on the surface of complexes with redox-active ligands
  • Ivanova T.M., Maslakov K.I., Sidorov A.A., Kiskin M.A., Linko R.V., Savilov S.V., Lunin V.V., Eremenko I.L.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 238, с. 146878 DOI
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  • 2019 Conduction band electronic states of ultrathin layers of thiophene/phenylene co-oligomers on an oxidized silicon surface
  • Komolov A.S., Lazneva E.F., Gerasimova N.B., Panina Yu A., Sobolev V.S., Koroleva A.V., Pshenichnyuk S.A., Asfandiarov N.L., Modelli A., Handke B., Borshchev O.V., Ponomarenko S.A.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 235, с. 40-45 DOI
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  • 2018 The role of multipolarity in quantitative analysis of EELFS spectra
  • Bakieva O.R., Nemtsova O.M.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 222, с. 15-23 DOI
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  • 2016 Electronic structure of octahedrally coordinated Cr in Cr x TiX 2 (X = Se, Te) and Ti x Cr 1-x Se 2
  • Shkvarin A.S., Yablonkikh M.V., Yarmoshenko Yu M., Merentsov A.I., Senkovskiy B.V., Avila J., Asensio M., Titov A.N.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 206, с. 12-17
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  • 2016 Local atomic structure of solid solutions with overlapping shells by EXAFS: the regularization method
  • Babanov Yu A., Ponomarev D.A., Ustinov V.V., Baranov A.N., Zubavichus Ya V.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 211, с. 1-11 DOI
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  • 2015 Dichroism in the photoionisation of atoms at XUV free-electron lasers
  • Mazza T., Gryzlova E.V., Grum-Grzhimailo A.N., Kazansky A.K., Kabachnik N.M., Meyer M.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 204, с. 313-321 DOI
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  • 2015 Similarity between the angular distributions of the first- and second-step electrons in sequential two-photon atomic double ionization
  • Gryzlova E.V., Grum-Grzhimailo A.N., Staroselskaya E.I., Strakhova S.I.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 204, с. 277-283 DOI
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  • 2015 XPS study of the electron structure of heterometallic trinuclear complexes Fe2M(μ3-O)(μ-Piv)6(HPiv)3 (M=Mn,Co, Ni)
  • Ivanova T.M., Kochur A.G., Maslakov K.I., Kiskin M.A., Savilov S.V., Lunin V.V., Novotortsev V.M., Eremenko I.L.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 205, с. 1-5 DOI
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  • 2014 Polarization-dependent NEXAFS study of adsorption of long-chain surfactants on mechanically milled iron powder
  • Syugaev A.V., Maratkanova A.N.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 195, с. 71-77
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  • 2014 XPS study of the influence of minute additions of carbon metal-containing nanoforms on the polymer structure
  • Shabanova I.N., Terebova N.S., Sapozhnikov G.V.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 195, с. 43-47 DOI
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  • 2013 The problem of XANES spectrum interpretation measured by TEY technique at different photon glancing angles
  • Andreeva M.A., Repchenko Yu L., Domashevaskaya E.P., Terekhov V.A., Seredin P.V., Kashkarov V.M.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 191, с. 35-40 DOI
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  • 2012 Determination of an optimal modifier for albumin for medicobiological technology by the X-ray photoelectron spectroscopy method
  • Shabanova I.N., Terebova N.S., Naimushina E.A.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 185, с. 609-614
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  • 2012 The combined energy analyzer composed of electrostatic mirror fields
  • Ashimbaeva B.U., Chokin K.Sh, Saulebekov A.O., Kambarova Zh T.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 185, № 11, с. 518-522 DOI
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  • 2011 X-ray photoelectron spectroscopy study of electron and spatial structure of mono- and binuclear Ni(II) carboxylate complexes with nitrogen-containing ligands
  • Kochur A.G., Ivanova T.M., Hinder S.J., Watts J.F., Sidorov A.A., Kiskin M.A., Novotortsev V.M., Eremenko I.L.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 184, № 8-10, с. 501-507 DOI
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  • 2010 Electron energy loss spectroscopy for quantitative analysis of the local atomic structure of superthin oxide films on the surface of 3d-metals
  • Guy D., Bakieva O., Grebennikov V., Surnin D., Ruts Y.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 182, № 3, с. 115-126 DOI
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  • 2010 THE DETERMINATION OF THE TRUE PROFILE OF XPS LINE BY REGU-LARIZATION METHOD I. Mathematical algorithm and numerical simulations
  • Babanov Y., Nemtsova O., Kamensky I., Mikhailova S.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 3, с. 90-96 DOI
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  • 2010 Two-color experiments in the gas phase at FLASH
  • Meyer M., Cubaynes D., Dardis J., Hayden P., Hough P., Richardson V., Kennedy E.T., Costello J.T., Dusterer S., Li W.B., Radcliffe P., Redlin H., Feldhaus J., Strakhova S.I., Gryzlova E.V., Grum-Grzhimailo A.N., Taieb R., Maquete A.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 181, № 2-3, с. 111-115 DOI
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  • 2010 X-ray photoelectron Fe3s and Fe3p spectra of polynuclear trimethylacetate iron complexes
  • Kochur A.G., Ivanova T.M., Shchukarev A.V., Linko R.V., Sidorov A.A., Kiskin M.A., Novotortsev V.M., Eremenko I.L.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 180, № 1-3, с. 21-26 DOI
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  • 2007 A symmetry analysis of circular dichroism in photoabsorption of fixed-in-space molecules: Chiral and nondipole effects
  • Grum-Grzhimailo A.N., Lucchese R.R., Prumper G., Ueda K.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 155, № 1-3, с. 104-108 DOI
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  • 2007 Electron impact ionization of atoms at large momentum transfer: Renormalized plane wave first-order models
  • Kouzakov K.A., Vinitsky P.S., Popov Y.V., Dal Cappello C.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 161, № 1-3, с. 35-37 DOI
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  • 2007 Mechanisms of superconductivity studied by two-particle emission
  • Kouzakov K.A., Berakdar J.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 161, № 1-3, с. 121-124 DOI
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  • 2007 On the role of the Coulomb potential in strong field atomic ionization dynamics
  • Tetchou H.M., Giraud S., Piraux B., Popov Yu V., Kwato M.G.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 161, № 1-3, с. 178-181 DOI
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  • 2007 Projection methods for the analysis of molecular-frame photoelectron angular distributions - I: Minimal parameterizations in the dipole limit
  • Lucchese R.R., Montuoro R., Grum-Grzhimailo A.N., Liu X.J., Prumper G., Morishita Y., Saito N., Ueda K.
  • в журнале Journal of Electron Spectroscopy and Related Phenomena, издательство Elsevier BV (Netherlands), том 155, № 1-3, с. 95-99 DOI