Applied Surface Scienceжурнал

Редколлегия

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• Алов Н.В., с 1 января 2005

Статьи, опубликованные в журнале стиль:  обычный | ГОСТ | plain | abbrv | acm | alpha | amsalpha | amsplain | apalike | ieeetr | siam

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  • 2019 Oxygen detection using nanostructured TiO2 thin films obtained by the molecular layering method
  • Mokrushin Artem S., Simonenko Elizaveta P., Simonenko Nikolay P., Akkuleva Karina T., Antipov Vladymir V., Zaharova Natalia V., Malygin Anatolii A., Bukunov Kirill A., Sevastyanov Vladimir G., Kuznetsov Nikolay T.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 463, с. 197-202 DOI
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  • 2018 Angle-dependent sputter yield of rippled surfaces
  • Shulga V.I.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 458, с. 18-23
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  • 2018 Anodic oxidation of Al/Ge/Al multilayer films
  • Beltiukov A.N., Stashkova E.V., Boytsova O.V.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 459, с. 583-587 DOI
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  • 2018 Application of Valence-to-core X-ray Emission Spectroscopy for Identification and Estimation of Amount of Carbon Covalently Bonded to Chromium in Amorphous Cr-C Coatings Prepared by Magnetron Sputtering
  • Safonov V.A., Habazaki H., Glatzel P., Fishgoit L.A., Drozhzhin O.A., Lafuerza S., Safonova O.V.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 427, с. 566-572 DOI
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  • 2018 Cobalt – carbon nanocomposite catalysts of gas-phase hydrodechlorination of chlorobenzene
  • Klokov S.V., Lokteva E.S., Golubina E.V., Chernavskii P.A., Maslakov K.I., Egorova T.B., Chernyak S.A., Minin A.S., Konev A.S.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), с. 1-15 DOI
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  • 2018 Jellyfish-like few-layer graphene nanoflakes: Synthesis, oxidation, and hydrothermal N-doping
  • Chernyak Sergei A., Podgornova Angelina M., Arkhipova Ekaterina A., Novotortsev Roman O., Egorova Tolganay B., Ivanov Anton S., Maslakov Konstantin I., Savilov Serguei V., Lunin Valery V.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 439, с. 371-373 DOI
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  • 2018 Note on the artefacts in SRIM simulation of sputtering
  • Shulga V.I.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 439, с. 456-461 DOI
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  • 2018 Ordered misfit dislocations in epitaxial Gd doped CeO2 thin films deposited on (001) YSZ single crystal substrates
  • Petrișor Jr T., Meledin A., Boulle A., Moș R.B., Gabor M.S., Ciontea L., Petrișor T.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 433, с. 668-673 DOI
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  • 2018 The Au modified Ge(1 1 0) surface
  • Zhang L., Kabanov N.S., Bampoulis P., Saletsky A.M., Zandvliet H.J.W, Klavsyuk A.L.
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 439, с. 101-105 DOI
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  • 2018 XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples
  • Maslakov Konstantin I., Teterin Yury A., Popel Aleksej J., Teterin Anton Yu, Ivanov Kirill E., Kalmykov Stepan N., Petrov Vladimir G., Petrov Peter K., Farnan Ian
  • в журнале Applied Surface Science, издательство Elsevier BV (Netherlands), том 448, с. 154-162 DOI