23rd International Symposium “Nanostructures: Physics and Technology”журнал

Статьи, опубликованные в журнале

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• • 2015 Domain Structure Characterization in Hexagonal Semiconductors Using Small-Angle X-Ray Scattering
  • Sharkov M.D., Boiko M.E., Bobyl A.V., Boiko A.M., Budkina N.S., Konnikov S.G.
  • в журнале 23rd International Symposium “Nanostructures: Physics and Technology”, с. 170-171 DOI