ИСТИНА

One of the main problems of modern organic light-emitting diodes (OLEDs), especially blue ones, is their insufficient lifetime in operating conditions. One of the key reasons for OLEDs’ degradation is associated with the degradation of the organic emission layers and their interfaces mainly within the electron-hole recombination zone, where the exciton density is high. As a result, the energy density is high as well, which can result in a high probability of degradation. The spatial profile of the recombination rate within the emission layer is determined mainly by energy barriers at the interface of adjacent layers. In this work, using drift-diffusion numerical model with direct recombination approximation, the optimization possibilities of the charge carrier recombination rate spatial distribution by selection of optimal transport layer materials have been investigated.