Josephson Effect in SFNS Josephson Junctions

Karminskaya, T.Y.; Kupriyanov, M.Y.; Golubov, A.A.; Sidorenko, A.S.

Авторы: Karminskaya T.Yu, Kupriyanov M.Yu, Golubov A.A., Sidorenko A.S.
Сборник: Fundamentals of Superconducting Nanoelectronics
Серия: NanoScience and Technology
Глава в коллективной монографии
Год издания: 2011
Место издания: Springer Berlin Heidelberg
Первая страница: 171
Последняя страница: 218
DOI: 10.1007/978-3-642-20158-5_7
Аннотация: The critical current, I C, of Josephson junctions both in ramp-type (S-FN-S) and in overlap (SNF-FN-FNS, SN-FN-NS, SNF-N-FNS) geometries has been calculated in the frame of linearized Usadel equations (S–superconductor, F–ferromagnetic, N–normal metal). For the ramp-type structures, in which S electrodes contact directly the end walls of FN bilayer, it is shown that I C may exhibit damping oscillations as a function of both the distance L between superconductors and thicknesses d F,N of ferromagnetic and normal layers. The conditions have been determined under which the decay length and period of oscillation of I C(L) at fixed d F are of the order of decay length of superconducting correlations in the N metal, ξN, that is much larger than in F film. In overlap configurations, in which S films are placed on the top of NF bilayer, the studied junctions have complex SNF or SN electrodes (N or NF bilayer are situated under a superconductor). We demonstrate that in these geometries the critical current can exceed that in ramp-type junctions. Based on these results, the choice of the most practically applicable geometry is discussed.
Добавил в систему: Куприянов Михаил Юрьевич

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Josephson Effect in SFNS Josephson Junctionsстатья

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