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Thickness dependence of crystalline state in FeZrNbCuB thin films obtained by sputter depositionстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
- Авторы: Coisson Marco, Celegato Federica, Olivetti Elena S., Tiberto Paola, Vinai Franco, Kane Shashank N., Gan'shina Elena A., Novikov Andrey I., Perov Nikolai S.
- Журнал: Journal of Alloys and Compounds
- Том: 509
- Номер: 14
- Год издания: 2011
- Издательство: Elsevier BV
- Местоположение издательства: Netherlands
- Первая страница: 4688
- Последняя страница: 4695
- DOI: 10.1016/j.jallcom.2011.01.036
- Аннотация: Differential scanning calorimetry, hysteresis measurements, X-ray diffraction, Mossbauer spectroscopy and transversal Kerr effect have been used to study the thickness and temperature dependence of magnetic properties and crystalline state of Fe(84)Zr(3.5)Nb(3.5)B(8)Cu(1) (at.%) thin films. Results indicate that a decrease of the saturation magnetization with increasing film thickness can be ascribed to the presence of a crystalline alpha-Fe phase at the early stages of film growth, followed by the deposition of the amorphous alloy. Thinner films, which have a significant crystalline phase in the as-prepared state, display less prominent crystallization features, whereas thicker films, with a significant amorphous phase in the as-prepared state, are characterized by much more pronounced crystallization effects, that are confirmed by Mossbauer and Transversal Kerr Effect measurements. Progressive thinning of a film by means of sputter etching allows to reduce the amorphous component, leading to the expected increase of saturation magnetization as the thickness decreases. (C) 2011 Elsevier B.V. All rights reserved.
- Добавил в систему: Перов Николай Сергеевич