Lattice strain in the epitaxial thin films of perovskitesстатья
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Дата последнего поиска статьи во внешних источниках: 14 ноября 2016 г.
Аннотация:The epitaxial films of perovskite manganites (La1−xPrx)0.7Ca0.3MnO3 (x=0–1) and nickelates RNiO3 (R=Pr, Nd, Sm, Gd) were grown by single source MOCVD on perovskite substrates producing anisotropic lattice strain in the film. We applied the data on the metal–insulator transition in the perovskite films as a probe for the microscopic strain mechanism. As a result, the anisotropic tilting of the rigid octahedra was deduced for the manganites and octahedra deformation for the nickelates.